Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / Dong ZhiLi.Material type: TextSeries: Advances in materials science and engineeringPublisher: Boca Raton, FL : CRC Press, 2022Edition: First editionDescription: xix,266pContent type:
- 543 ZHI
|Item type||Current library||Collection||Call number||Copy number||Status||Notes||Date due||Barcode||Item holds|
|Books||IIT Goa Central Library||Reference||543 ZHI (Browse shelf(Opens below))||1||Reference||NPH/23-24/IN-00080||31/05/2023||37.00%||GBP 99.99||4149|
Includes bibliographical references and index.
"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- Provided by publisher.