Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / Dong ZhiLi.
Material type: TextSeries: Advances in materials science and engineeringPublisher: Boca Raton, FL : CRC Press, 2022Edition: First editionDescription: xix,266pContent type:- text
- unmediated
- volume
- 9780367357948
- 543 ZHI
Item type | Current library | Collection | Call number | Copy number | Status | Notes | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|---|
Books | IIT Goa Central Library | Reference | 543 ZHI (Browse shelf(Opens below)) | 1 | Reference | NPH/23-24/IN-00080||31/05/2023||37.00%||GBP 99.99 | 4149 |
Includes bibliographical references and index.
"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- Provided by publisher.