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Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / Dong ZhiLi.

By: Material type: TextTextSeries: Advances in materials science and engineeringPublisher: Boca Raton, FL : CRC Press, 2022Edition: First editionDescription: xix,266pContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9780367357948
Subject(s): Additional physical formats: Online version:: Fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientistsDDC classification:
  • 543 ZHI
Summary: "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- Provided by publisher.
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Includes bibliographical references and index.

"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- Provided by publisher.

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