Fewster, Paul F., <br/><br/>
X-ray scattering from semiconductors and other materials / 
Paul F. Fewster, PANalytical Research Centre, UK. 
 - 3rd edition. 
 - xvi, 493 pages :  illustrations ;  24 cm 
<br/><br/>Includes bibliographical references (pages 475-476) and index. 
<br/><br/>An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns. 
<br/><br/><label>ISBN: </label>9789814436922 (hbk. : alk. paper) 
<br/><br/><label>LCCN: </label>2014031060 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-rays--Scattering.<br/>Semiconductors.
<br/><br/><label>Dewey Class. No.: </label>537.535  / FEW