TY  - BOOK
AU  - Fewster,Paul F.
TI  - X-ray scattering from semiconductors and other materials
SN  - 9789814436922 (hbk. : alk. paper)
U1  - 537.535 23
PY  - 2015///]
CY  - New Jersey
PB  - World Scientific
KW  - X-rays
KW  - Scattering
KW  - Semiconductors
N1  - Includes bibliographical references (pages 475-476) and index; An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns
ER  -