In situ characterization of thin film growth / 
edited by Gertjan Koster and Guus Rijnders. 
 - Cambridge ;  Philadelphia, PA :  Woodhead Publishing (Elsevier),  2011. 
 - xi, 282 p. :  ill. ;  24 cm. 
 - Woodhead Publishing in materials .
 - Woodhead Publishing in materials. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781845699345 
<br/><br/><label>LCCN: </label>2011935503 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films--Analysis.<br/>Crystal growth.
<br/><br/><label>Dewey Class. No.: </label>530.4275  / INS