01691cam a22004217a 4500 16895353 OSt 20260623115651.0 110729s2011 enka b 001 0 eng d 2011935503 9781845699345 16895353 (OCoLC)701810022 BTCTA eng BTCTA YDXCP BWX TXA BDX CDX DLC lccopycat 530.4275 INS In situ characterization of thin film growth / edited by Gertjan Koster and Guus Rijnders. Cambridge ; Philadelphia, PA : Woodhead Publishing (Elsevier), 2011. xi, 282 p. : ill. ; 24 cm. text txt rdacontent unmediated n rdamedia volume nc rdacarrier Woodhead Publishing in materials Includes bibliographical references and index. Thin films Analysis. 3868 Crystal growth. 3869 Koster, Gertjan, 1971- editor 3870 Rijnders, Guus. editor 3871 Woodhead Publishing in materials. 3872 Contributor biographical information http://www.loc.gov/catdir/enhancements/fy1210/2011935503-b.html Publisher description http://www.loc.gov/catdir/enhancements/fy1210/2011935503-d.html Table of contents only http://www.loc.gov/catdir/enhancements/fy1210/2011935503-t.html 7 cbc copycat 2 ncip 20 y-gencatlg ddc BK 0 0 ddc 0 3 REF IITGCL IITGCL REF 2026-06-23 New India Book Agency 22027.00 0 530.4275 INS 4705 2026-06-23 11:40:05 1 22027.00 2026-06-23 REF 7220||03-06-2026||41.00%||USD 230.00 1938 1938