Dong, ZhiLi, <br/><br/>
Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / 
Dong ZhiLi. 
 - First edition. 
 - xix,266p. 
 - Advances in materials science and engineering .
<br/><br/>Includes bibliographical references and index. 
<br/><br/> "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- 
<br/><br/><label>ISBN: </label>9780367357948 
<br/><br/><label>LCCN: </label>2021056285 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Analysis.<br/>Crystallography.<br/>X-ray diffraction imaging.<br/>Transmission electron microscopy.
<br/><br/><label>Dewey Class. No.: </label>543  / ZHI