TY - BOOK AU - Dong,ZhiLi TI - Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists T2 - Advances in materials science and engineering SN - 9780367357948 U1 - 543 PY - 2022/// CY - Boca Raton, FL PB - CRC Press KW - Materials KW - Analysis KW - Crystallography KW - X-ray diffraction imaging KW - Transmission electron microscopy N1 - Includes bibliographical references and index N2 - "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- ER -