| 000 | 01376cam a2200313 i 4500 | ||
|---|---|---|---|
| 001 | 18337391 | ||
| 005 | 20230516103650.0 | ||
| 008 | 141016t20152015njua b 001 0 eng c | ||
| 010 | _a 2014031060 | ||
| 020 | _a9789814436922 (hbk. : alk. paper) | ||
| 040 |
_aOU/DLC _beng _cOU _erda _dDLC |
||
| 042 | _apcc | ||
| 082 | 0 | 0 |
_a537.535 _223 _bFEW |
| 100 | 1 |
_aFewster, Paul F., _eauthor. _91135 |
|
| 245 | 1 | 0 |
_aX-ray scattering from semiconductors and other materials / _cPaul F. Fewster, PANalytical Research Centre, UK. |
| 250 | _a3rd edition. | ||
| 264 | 1 |
_aNew Jersey : _bWorld Scientific, _c[2015] |
|
| 300 |
_axvi, 493 pages : _billustrations ; _c24 cm |
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| 336 |
_atext _2rdacontent |
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| 337 |
_aunmediated _2rdamedia |
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| 338 |
_avolume _2rdacarrier |
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| 504 | _aIncludes bibliographical references (pages 475-476) and index. | ||
| 505 | 0 | _aAn introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns. | |
| 650 | 0 |
_aX-rays _xScattering. _92489 |
|
| 650 | 0 |
_aSemiconductors. _92434 |
|
| 906 |
_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 999 |
_c1319 _d1319 |
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