| 000 | 01245cam a22003017a 4500 | ||
|---|---|---|---|
| 001 | 15035945 | ||
| 005 | 20230201110654.0 | ||
| 008 | 071005s2008 enk b 001 0 eng | ||
| 010 | _a 2007041704 | ||
| 020 | _a9780470027851 | ||
| 040 |
_aDLC _cDLC _dDLC |
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| 082 | 0 | 0 |
_a620.11299 _222 _bBRA |
| 100 | 1 |
_aBrandon, D. G. _92273 |
|
| 245 | 1 | 0 |
_aMicrostructural characterization of materials / _cDavid Brandon and Wayne Kaplan. |
| 250 | _a2nd ed. | ||
| 260 |
_aChichester, England : _bJohn Wiley & Sons, _cc2008. |
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| 300 |
_axiv, 536 p. : _bill. (some col.) ; _c25 cm. |
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| 490 | 0 | _aQuantitative software engineering series | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aMaterials _xMicroscopy. _92274 |
|
| 650 | 0 |
_aMicrostructure. _92275 |
|
| 700 | 1 |
_aKaplan, Wayne D. _91228 |
|
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0827/2007041704-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0827/2007041704-t.html |
| 906 |
_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 999 |
_c1361 _d1361 |
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