000 | 01262cam a2200289 a 4500 | ||
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001 | 689463 | ||
005 | 20230123153525.0 | ||
008 | 960304s1997 nyua b 001 0 eng | ||
010 | _a 96012448 | ||
020 | _a9780471155737 | ||
040 |
_aDLC _cDLC _dDLC |
||
082 | 0 | 0 |
_a621.38224011 _220 _bTES |
100 | 1 |
_aTesche, Frederick M. _91246 |
|
245 | 1 | 0 |
_aEMC analysis methods and computational models / _cby Frederick M. Tesche, Michel V. Ianoz, Torbjörn Karlsson. |
260 |
_aNew York : _bJohn Wiley & Sons, Inc., _cc1997. |
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300 |
_axxvi, 623 p. : _bill. ; _c24 cm. |
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504 | _aIncludes bibliographical references and index. | ||
650 | 0 |
_aElectromagnetic compatibility _xMathematical models. _92202 |
|
700 | 1 |
_aIanoz, M. _q(Michel) _92203 |
|
700 | 1 |
_aKarlsson, Torbjörn. _92204 |
|
856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley042/96012448.html |
856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley033/96012448.html |
856 | 4 |
_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix04/96012448.html |
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906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
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942 |
_2ddc _cBK |
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999 |
_c1369 _d1369 |