000 01262cam a2200289 a 4500
001 689463
005 20230123153525.0
008 960304s1997 nyua b 001 0 eng
010 _a 96012448
020 _a9780471155737
040 _aDLC
_cDLC
_dDLC
082 0 0 _a621.38224011
_220
_bTES
100 1 _aTesche, Frederick M.
_91246
245 1 0 _aEMC analysis methods and computational models /
_cby Frederick M. Tesche, Michel V. Ianoz, Torbjörn Karlsson.
260 _aNew York :
_bJohn Wiley & Sons, Inc.,
_cc1997.
300 _axxvi, 623 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index.
650 0 _aElectromagnetic compatibility
_xMathematical models.
_92202
700 1 _aIanoz, M.
_q(Michel)
_92203
700 1 _aKarlsson, Torbjörn.
_92204
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/wiley042/96012448.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley033/96012448.html
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix04/96012448.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
999 _c1369
_d1369