000 02026cam a22003738i 4500
001 22313798
005 20230630151826.0
008 211117s2022 flu b 001 0 eng
010 _a 2021056285
020 _a9780367357948
_q(hbk)
040 _aDLC
_beng
_erda
_cDLC
042 _apcc
082 0 0 _a543
_bZHI
100 1 _aDong, ZhiLi,
_eauthor.
_92549
245 1 0 _aFundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists /
_cDong ZhiLi.
250 _aFirst edition.
263 _a2204
264 1 _aBoca Raton, FL :
_bCRC Press,
_c2022.
300 _axix,266p.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
490 0 _aAdvances in materials science and engineering
504 _aIncludes bibliographical references and index.
520 _a"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"--
_cProvided by publisher.
650 0 _aMaterials
_xAnalysis.
_92550
650 0 _aCrystallography.
_9581
650 0 _aX-ray diffraction imaging.
_92551
650 0 _aTransmission electron microscopy.
_92552
776 0 8 _iOnline version:
_aZhiLi, Dong.
_tFundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists
_bFirst edition.
_dBoca Raton, FL : CRC Press, 2022
_z9780429351662
_w(DLC) 2021056286
906 _a7
_bcbc
_corignew
_d1
_eecip
_f20
_gy-gencatlg
942 _2ddc
_cBK
999 _c1561
_d1561