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X-ray scattering from semiconductors and other materials /

Fewster, Paul F.,

X-ray scattering from semiconductors and other materials / Paul F. Fewster, PANalytical Research Centre, UK. - 3rd edition. - xvi, 493 pages : illustrations ; 24 cm

Includes bibliographical references (pages 475-476) and index.

An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.

ISBN: 9789814436922 (hbk. : alk. paper)

LCCN: 2014031060

Subjects--Topical Terms:
X-rays--Scattering.
Semiconductors.

Dewey Class. No.: 537.535 / FEW

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