X-ray scattering from semiconductors and other materials / (Record no. 1319)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 01376cam a2200313 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 18337391 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20230516103650.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 141016t20152015njua b 001 0 eng c |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| LC control number | 2014031060 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9789814436922 (hbk. : alk. paper) |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | OU/DLC |
| Language of cataloging | eng |
| Transcribing agency | OU |
| Description conventions | rda |
| Modifying agency | DLC |
| 042 ## - AUTHENTICATION CODE | |
| Authentication code | pcc |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 537.535 |
| Edition number | 23 |
| Item number | FEW |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Fewster, Paul F., |
| Relator term | author. |
| 9 (RLIN) | 1135 |
| 245 10 - TITLE STATEMENT | |
| Title | X-ray scattering from semiconductors and other materials / |
| Statement of responsibility, etc. | Paul F. Fewster, PANalytical Research Centre, UK. |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 3rd edition. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | New Jersey : |
| Name of producer, publisher, distributor, manufacturer | World Scientific, |
| Date of production, publication, distribution, manufacture, or copyright notice | [2015] |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xvi, 493 pages : |
| Other physical details | illustrations ; |
| Dimensions | 24 cm |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | unmediated |
| Source | rdamedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | volume |
| Source | rdacarrier |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references (pages 475-476) and index. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | X-rays |
| General subdivision | Scattering. |
| 9 (RLIN) | 2489 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors. |
| 9 (RLIN) | 2434 |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| a | 7 |
| b | cbc |
| c | orignew |
| d | 1 |
| e | ecip |
| f | 20 |
| g | y-gencatlg |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Source of acquisition | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Copy number | Price effective from | Koha item type | Public note |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Reference | Technical | IIT Goa Central Library | IIT Goa Central Library | International Book Agency | 8852.00 | 537.535/Few | 3781 | 2021-08-30 | 1 | 2021-08-30 | Reference | 21-22/IN164|| 05-07-21|| 33.00%|| USD 119 |