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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

By: Material type: TextTextPublication details: Switzerland Springer Sceince + Business Media 2016Edition: 2/eDescription: xi, 196pISBN:
  • 9783319398761
Subject(s): DDC classification:
  • 502 Ege
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Holdings
Item type Current library Collection Call number Copy number Status Notes Date due Barcode Item holds
Reference Reference IIT Goa Central Library Technical 502/Ege (Browse shelf(Opens below)) 1 Reference RBPPL76469/19-20|| 27-08-19|| 32.00%|| EUR 79.99 3014
Total holds: 0