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Results of search for 'an:493'
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Egerton, R. F.
Goodhew, Peter J.
Humphreys, John; Bea...
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Electron Microscopy
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1.
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
by
Egerton, R. F
Edition:
2/e
Material type:
Text
Publication details:
Switzerland
Springer Sceince + Business Media
2016
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IIT Goa Central Library: Reference
(1).
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2.
Electron Microscopy and Analysis
by
Goodhew, Peter J
Humphreys, John; Beanland, Richard
Edition:
3/e
Material type:
Text
Publication details:
London
CRC Press
2001
Availability:
Not available:
IIT Goa Central Library: Reference
(1).
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