X-ray scattering from semiconductors and other materials / Paul F. Fewster, PANalytical Research Centre, UK.
Material type:
TextPublisher: New Jersey : World Scientific, [2015]Edition: 3rd editionDescription: xvi, 493 pages : illustrations ; 24 cmContent type: - text
- unmediated
- volume
- 9789814436922 (hbk. : alk. paper)
- 537.535 23 FEW
Contents:
An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.
| Item type | Current library | Collection | Call number | Copy number | Status | Notes | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|---|
Reference
|
IIT Goa Central Library | Technical | 537.535/Few (Browse shelf(Opens below)) | 1 | Reference | 21-22/IN164|| 05-07-21|| 33.00%|| USD 119 | 3781 |
Total holds: 0
Browsing IIT Goa Central Library shelves, Collection: Technical Close shelf browser (Hides shelf browser)
| No cover image available | No cover image available | |||||||
| 537.53/Cul Elements of X-ray Diffraction | 537.53/Sho Electrons and Holes in Semiconductors | 537.53/Zwo Photoelectricity and its Application | 537.535/Few X-ray scattering from semiconductors and other materials / | 537.6/Ber Course of Theoretical Physics, Vol: 4 - Quantum Electrodynamics | 537.6/Gre Classical Electrodynamics | 537.6/Gri Introduction to Electrodynamics |
Includes bibliographical references (pages 475-476) and index.
An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.